Reflection Method of Determining Preferred Orientation on the Geiger‐Counter Spectrometer

摘要

A rapid and accurate method of determining preferred orientation in the surface of thick samples was devised using a reflection technique on the Geiger‐counter spectrometer. By presenting the specimen face to all possible angles with respect to the incident x‐ray beam, through use of a special fixture, and recording the intensity of diffraction on a potentiometer recorder, the relative number of planes of a given set at each orientation can be determined. The change of intensity due to the positioning of the specimen face away from the Bragg angle is taken care of by a correction formula which is experimentally verified. The method is especially valuable for dealing with thin layers on thick specimens.