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High‐Speed Microwave Switching of Semiconductors

机译:半导体的高速微波开关

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The high‐speed microwave semiconductor switch, employing an n‐type germanium diode, has been further investigated to determine the ultimate switching speed. Data are presented which show that pulse rise and decay times are as fast as 3 mμsec. This limit is imposed by the capacitances and inductances of the equipment and is not intrinsic to the germanium diode. The ultimate rise and decay times are determined by relaxation processes in the germanium, and are expected to be faster than 1 mμsec. Two switching pulses of variable spacing in time were employed to show that there are no essential residual processes in the germanium following the application of a pulse. Since there is then no measured dead time of switching, the pulse‐repetition rate is limited by the rise times and decay times. Measurements have been made on a series of semiconductor switches using different concentrations of donors. As the concentration is decreased, avalanche breakdown occurs at higher negative voltages which allows switching of higher microwave powers. Successful operation has been obtained with microwave powers as high as one watt impinging upon the semiconductor switch. In general, rise and decay times tend to increase as donors decrease. Thus, rise times and decay times of 10 mμsec were obtained at one watt of microwave power.
机译:采用n型锗二极管的高速微波半导体开关已被进一步研究,以确定最终的开关速度。呈现的数据表明,脉冲上升和衰减时间快至3毫秒。该限制由设备的电容和电感决定,并非锗二极管固有的。最终的上升和下降时间是由锗中的弛豫过程确定的,并且预计会快于1毫秒。采用两个时间间隔可变的开关脉冲表明,施加脉冲后,锗中没有必要的残留过程。由于此时没有测得的开关死区时间,因此脉冲重复率受到上升时间和衰减时间的限制。已经使用不同浓度的施主对一系列半导体开关进行了测量。随着浓度的降低,雪崩击穿在较高的负电压下发生,这允许切换较高的微波功率。高达1瓦的微波功率照射在半导体开关上,已获得成功的操作。通常,上升和下降时间倾向于随着供体的减少而增加。因此,在一瓦微波功率下获得的上升时间和衰减时间为10毫秒。

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    《Journal of Applied Physics 》 |1957年第11期| 共3页
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  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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