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Locally Er-Doped Near-Stoichiometric LiNbO_3 Crystals Prepared by Standard Er Diffusion and Post-VTE Treatment

机译:通过标准Er扩散和VTE后处理制备的局部掺Er的近化学计量LiNbO_3晶体

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摘要

The feasibility of preparing locally Er-doped near-stoichiometric (NS)LiNbO_3 crystals for integrated optics applications is demonstrated by a two-step process with standard diffusion (1130℃/154 h) of Er metal followed by vapor transport equilibration (VTE) treatment under three different conditions of 1135℃/22 h, 1115℃/50 h, and 1125℃/60 h. Detailed studies on the crystalline phase, Li composition, diffused surface roughness, and emission characteristics of Er~(3+) ions indicate that there is an upper limit on the initial Er metal film thickness: ~20 nm for an X-cut crystal and ~30 nm for a Z-cut crystal. When the initial Er film thickness is below this limit, the post-VTE does not induce formation of ErNbO_4 precipitate and the diffused surface retains high quality with a root mean square roughness <3 nm. Depending on the VTE condition adopted, the VTE results in the increase of ([Li] + [Er])/[Nb] ratio in the diffused layer from congruent point (94.5%) to 97.4%-99.4%. Secondary ion mass spectrometry study shows that the post-VTE does not affect the Gauss nature of the Er profile, but leads to the increase of diffusion depth by as much as 1.6 μm. In comparison with the standard Er diffusion, the post-VTE results in the decrease of Er diffusivity by three to nine times. The higher the VTE temperature is, the lower the Er diffusivity is. In addition, the post-VTE also results in definite reduction of OH content in crystal, slight lengthening of lifetime and slight narrowing of linewidth of Er~(3+) emission at 1530 nm.
机译:通过分两步进行Er金属的标准扩散(1130℃/ 154 h),然后进行汽运平衡(VTE)处理,证明了制备用于集成光学应用的局部掺Er的近化学计量(NS)LiNbO_3晶体的可行性。在1135℃/ 22 h,1115℃/ 50 h和1125℃/ 60 h的三个不同条件下。对Er〜(3+)离子的晶相,Li组成,扩散的表面粗糙度和发射特性的详细研究表明,初始Er金属膜厚度有一个上限:X切割晶体为〜20 nm, Z切割晶体约为30 nm。当初始Er膜厚度低于此极限时,后VTE不会诱导ErNbO_4沉淀的形成,并且扩散的表面会保持高质量,均方根粗糙度<3 nm。取决于采用的VTE条件,VTE导致扩散层中的[[Li] + [Er])/ [Nb]比从同等点(94.5%)增加到97.4%-99.4%。二次离子质谱研究表明,后VTE不会影响Er轮廓的高斯性质,但会导致扩散深度增加多达1.6μm。与标准的Er扩散相比,后VTE导致Er扩散率降低了三到九倍。 VTE温度越高,Er扩散率越低。此外,后VTE还导致晶体中OH含量的确定减少,寿命的轻微延长以及1530 nm处Er〜(3+)发射的线宽略微变窄。

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  • 来源
    《Journal of the American Ceramic Society》 |2009年第8期|1739-1747|共9页
  • 作者单位

    Department of Opto-Electronics and Information Engineering, School of Precision Instruments and Opto-Electronics Engineering, Tianjin University, Tianjin 300072, China Key Laboratory of Optoelectronic Information and Technical Science (Tianjin University), Ministry of Education, Tianjin 300072, China;

    Department of Opto-Electronics and Information Engineering, School of Precision Instruments and Opto-Electronics Engineering, Tianjin University, Tianjin 300072, China Key Laboratory of Optoelectronic Information and Technical Science (Tianjin University), Ministry of Education, Tianjin 300072, China;

    Department of Opto-Electronics and Information Engineering, School of Precision Instruments and Opto-Electronics Engineering, Tianjin University, Tianjin 300072, China Key Laboratory of Optoelectronic Information and Technical Science (Tianjin University), Ministry of Education, Tianjin 300072, China Department of Electronic Engineering, City University of Hong Kong, Kowloon, Hong Kong, China;

    Department of Opto-Electronics and Information Engineering, School of Precision Instruments and Opto-Electronics Engineering, Tianjin University, Tianjin 300072, China Key Laboratory of Optoelectronic Information and Technical Science (Tianjin University), Ministry of Education, Tianjin 300072, China;

    Department of Opto-Electronics and Information Engineering, School of Precision Instruments and Opto-Electronics Engineering, Tianjin University, Tianjin 300072, China Key Laboratory of Optoelectronic Information and Technical Science (Tianjin University), Ministry of Education, Tianjin 300072, China;

    Department of Opto-Electronics and Information Engineering, School of Precision Instruments and Opto-Electronics Engineering, Tianjin University, Tianjin 300072, China Key Laboratory of Optoelectronic Information and Technical Science (Tianjin University), Ministry of Education, Tianjin 300072, China;

    Department of Electronic Engineering, City University of Hong Kong, Kowloon, Hong Kong, China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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  • 正文语种 eng
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  • 入库时间 2022-08-17 13:42:00

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