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Fabrication of p-Type Li-Doped ZnO Films by RF Magnetron Sputtering

机译:射频磁控溅射制备p型掺锂ZnO薄膜

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摘要

The p-type Li-doped ZnO films are successfully deposited on a glass substrate by RF magnetron sputtering at room temperature. The pure, crystalline sputtering target of Li_XZn_(1-x)O_(1-X/2) with X in the range of 0-0.003 is fabricated using the powder synthesized by the thermal decomposition of a metal-nitrate-tartrate gel complex at 400°-800℃. The complex is prepared by dissolving nitrates of zinc and lithium in an aqueous solution with nitric and tartaric acids. The resulting compacts, which can be densified at 1400℃, exhibit a decreasing trend of electrical resistivity with increasing Li content. For the composition with 0.2 mol% Li, the p-type Li-doped ZnO film has an electrical resistivity of 1.3 Ω·cm, Hall mobility of 0.77 cm~2·(V·s)~(-1), carrier concentration of 6.67 × 10~(18) cm~(-3), and high optical transmittance in the visible region.
机译:通过在室温下通过RF磁控溅射将p型Li掺杂的ZnO膜成功地沉积在玻璃基板上。使用通过将金属硝酸盐-酒石酸盐凝胶络合物在60℃下热分解而合成的粉末,制得X范围为0-0.003的纯晶体溅射靶Li_XZn_(1-x)O_(1-X / 2)。 400°-800℃。通过用硝酸和酒石酸将锌和锂的硝酸盐溶解在水溶液中来制备配合物。所得的压坯可在1400℃下致密,随着Li含量的增加,电阻率呈下降趋势。对于具有0.2 mol%Li的组合物,p型掺杂Li的ZnO膜的电阻率为1.3Ω·cm,霍尔迁移率为0.77 cm〜2·(V·s)〜(-1),载流子浓度为6.67×10〜(18)cm〜(-3),可见区域的透光率高。

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  • 来源
    《Journal of the American Ceramic Society》 |2010年第7期|P.1860-1862|共3页
  • 作者单位

    Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu, Taiwan Material and Chemical Research Laboratories, Industrial Technology Research Institute, Hsinchu, Taiwan;

    rnMaterial and Chemical Research Laboratories, Industrial Technology Research Institute, Hsinchu, Taiwan;

    rnDepartment of Materials Science and Engineering, National Tsing Hua University, Hsinchu, Taiwan;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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  • 入库时间 2022-08-17 13:40:35

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