首页> 外文期刊>Japanese journal of applied physics >Improvement of self-heating effect in Ge vertically stacked GAA nanowire pMOSFET by utilizing Al_2O_3 for high-performance logic device and electrical/thermal co-design
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Improvement of self-heating effect in Ge vertically stacked GAA nanowire pMOSFET by utilizing Al_2O_3 for high-performance logic device and electrical/thermal co-design

机译:利用AL_2O_3对高性能逻辑装置和电气/热共同设计来改进GE垂直堆叠GAA纳米线PMOSFET的自热效应

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摘要

For improving self-heating effect (SHE) in Ge vertically stacked gate-all-around (GAA) nanowire (NW) p-type metal-oxide-semiconductor field-effect transistor (pMOSFET), aluminum oxide (Al2O3, alumina) is utilized for gate dielectric layer. From the high thermal conductivity of Al2O3, SHE is significantly improved. In order to validate the proposed device structure, technology computer-aided design simulation is performed through Synopsys Sentaurus three-dimensional tool. As a result, when Al2O3 is incorporated in Ge vertically stacked GAA NW pMOSFET, SHE can be remarkably improved from 534 to 419 K. In addition, the method of simultaneously accomplishing improvement of SHE and low gate leakage current (I-gate) have been specifically investigated and proposed with numerous simulation data.
机译:为了改善GE垂直堆叠的栅极(GaA)纳米线(NW)P型金属氧化物半导体场效应晶体管(PMOSFET),利用氧化铝(Al 2 O 3,氧化铝)中的自热效果(HEA)。 用于栅极介电层。 从Al2O3的高导热率来看,她得到了显着改善。 为了验证所提出的设备结构,通过Synopsys Sentaurus三维工具执行技术计算机辅助设计模拟。 结果,当Al2O3掺入Ge垂直堆叠的GaaNWPMOSFET时,她可以从534到419 K中显着提高。此外,同时实现了她和低栅极漏电流(I-Gate)的方法 专门研究并提出了许多模拟数据。

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