Scanning Differential-Phase-Contrast Hard X-Ray Microscopy with Wedge Absorber Detector

摘要

A new and simple idea for scanning differential-phase-contrast (S-DPC) hard X-ray microscopy has been proposed. It only uses a wedge absorber coupled with two intensity detectors, and is much more sensitive to sample structures than absorption contrast. It can also extract pure quantitative one-dimensional phase gradient given by a sample without an effect of sample absorption. The S-DPC microscope has been constructed at BL24XU of SPring-8, and its feasibility has been successfully demonstrated at the photon energy of 10 keV by clearly visualizing structures of samples. Further, the experimental phase gradient profile agrees well with simulation. By integrating the resultant phase gradient, the corresponding phase shift distribution could be also imaged.