首页> 外文期刊>Japanese Journal of Applied Physics. Part 1, Regular Papers, Brief Communications & Review Papers >X-ray Shielding of an Ionizer using Low-Energy X-rays below 9.5 keV for Ultra-Clean Assembly Line of Electronic Devices
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X-ray Shielding of an Ionizer using Low-Energy X-rays below 9.5 keV for Ultra-Clean Assembly Line of Electronic Devices

机译:使用低于9.5 keV的低能X射线对离子发生器进行X射线屏蔽,用于电子设备的超净装配线

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摘要

An ionizer has been developed using a low-energy X-ray for producing ion pairs that are transported by clean air through a shielding plate to objects to be discharged. The shielding plate should shield the X-ray of below 9.5 keV, while it should pass sufficient amount of the ion pairs. In this study, characteristics of the structural condition of the shielding plate has been investigated, on both the shielding effect and the ability to pass the ion pairs. We confirmed the structural condition that the leakage dose rate of the low-energy X-rays could be decreased to less than 1 μSv/h while allowing the passage of enough ion pairs to eliminate the static electricity.
机译:已经开发出一种使用低能X射线的电离器,用于产生离子对,这些离子对被清洁的空气通过屏蔽板传输到要排放的物体上。屏蔽板应屏蔽9.5 keV以下的X射线,同时应使足够数量的离子对通过。在这项研究中,研究了屏蔽板结构条件的特性,包括屏蔽效果和通过离子对的能力。我们确认了结构条件,即低能量X射线的泄漏剂量率可以降低到小于1μSv/ h,同时允许足够的离子对通过以消除静电。

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