首页> 外文期刊>Japanese journal of applied physics >Experimental Investigation of Pattern Layout Effect on Radio-Frequency Performance of Thin-Film Silicon-on-Insulator Power Metal-Oxide-Semiconductor Field-Effect Transistors
【24h】

Experimental Investigation of Pattern Layout Effect on Radio-Frequency Performance of Thin-Film Silicon-on-Insulator Power Metal-Oxide-Semiconductor Field-Effect Transistors

机译:图案布局对绝缘体上硅功率金属氧化物半导体场效应晶体管射频性能影响的实验研究

获取原文
获取原文并翻译 | 示例
获取外文期刊封面目录资料

摘要

This paper describes design considerations for the thin-film silicon-on-insulator power metal-oxide-semiconductor field-effect transistors for linear-amplification applications. The linear-amplification characteristics and DC performance depend on the grand interconnection pattern. We prefer to put the grand pattern on the drain (output) side. There are optimum finger lengths that provide the best linear amplification characteristics. The finger length also depends on the operating frequency and total gate width.
机译:本文介绍了用于线性放大应用的绝缘体上薄膜硅功率金属氧化物半导体场效应晶体管的设计注意事项。线性放大特性和直流性能取决于整体互连模式。我们更喜欢将隆重的图案放在排水(输出)侧。有最佳的指状长度,可提供最佳的线性放大特性。手指的长度还取决于工作频率和总栅极宽度。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号