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首页> 外文期刊>Japanese journal of applied physics >Crystallization and Melting Kinetics of Zn-Doped Fast-Growth Sb_(70)Te_(30) Phase-Change Recording Films
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Crystallization and Melting Kinetics of Zn-Doped Fast-Growth Sb_(70)Te_(30) Phase-Change Recording Films

机译:掺锌快速生长Sb_(70)Te_(30)相变记录膜的结晶和熔融动力学

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摘要

Doping Zn into the fast-growth Sb_(70)Te_(30) recording film can improve the archival stability and recording sensitivity, but the initialization and erasing processes will become more difficult. In order to obtain sufficiently high recording sensitivity and archival stability, while maintain adequate initialization and erasing abilities for the rewritable optical memories, the optimal doping concentration of Zn in the Sb_(70)Te_(30) recording film should locate between 5.3 and 17.9 at. %.
机译:向快速生长的Sb_(70)Te_(30)记录膜中掺杂Zn可以改善存档稳定性和记录灵敏度,但是初始化和擦除过程将变得更加困难。为了获得足够高的记录灵敏度和存档稳定性,同时为可重写光学存储器保持足够的初始化和擦除能力,Sb_(70)Te_(30)记录膜中Zn的最佳掺杂浓度应位于5.3和17.9之间。 %。

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  • 来源
    《Japanese journal of applied physics 》 |2009年第3issue2期| 265-268| 共4页
  • 作者单位

    Department of Materials Science and Engineering, National Chung Hsing University, Taichung 40227, Taiwan, R.O.C.;

    Department of Materials Science and Engineering, National Chung Hsing University, Taichung 40227, Taiwan, R.O.C.;

    Department of Materials Science and Engineering, National Chung Hsing University, Taichung 40227, Taiwan, R.O.C.;

    Materials Research Laboratory, ITRI, Hsinchiu 31040, Taiwan, R.O.C.;

    Materials Research Laboratory, ITRI, Hsinchiu 31040, Taiwan, R.O.C.;

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