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首页> 外文期刊>Japanese journal of applied physics >Isobutane/N_2 Pulsed Radio Frequency Magnetron Plasma Chemical Vapor Deposition of Hydrogenated Amorphous Carbon Nitride Films for Field Emission Applications
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Isobutane/N_2 Pulsed Radio Frequency Magnetron Plasma Chemical Vapor Deposition of Hydrogenated Amorphous Carbon Nitride Films for Field Emission Applications

机译:氢化非晶氮化碳膜的异丁烷/ N_2脉冲射频磁控等离子体化学气相沉积,用于场发射应用

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摘要

Radio frequency (rf) supermagnetron plasma was modulated by pulse and was applied to the deposition of hydrogenated amorphous carbon nitride (a-CN_x:H) films. The range of upper/lower electrode rf powers (UPRF/LORF) was selected as 200/50-800 W, and films were deposited using isobutane (i-C_4H_(10))/N_2 plasma. Phase-controlled rf power (13.56 MHz) was modulated by a 2.5-kHz pulse frequency, and the duty ratio was selected as 12.5%. With increases in LORF, the optical band gap decreased from 1.3 to 0.6 eV, and the hardness became sufficiently high, reaching a peak (34 GPa) at LORFs of 200 and 400 W. A low field emission threshold of 11 V/μm was obtained in the films deposited at LORF of 400 W, and gas pressure of 4 Pa.
机译:通过脉冲调制射频(rf)超磁控等离子体,并将其应用于氢化非晶碳氮化物(a-CN_x:H)膜的沉积。上/下电极射频功率(UPRF / LORF)的范围选择为200 / 50-800 W,并使用异丁烷(i-C_4H_(10))/ N_2等离子体沉积膜。相位控制的射频功率(13.56 MHz)通过2.5 kHz脉冲频率进行调制,占空比选择为12.5%。随着LORF的增加,光学带隙从1.3 eV降低到0.6 eV,硬度变得足够高,在200和400 W的LORF处达到峰值(34 GPa)。获得的低场发射阈值为11 V /μm在LORF为400 W,气压为4 Pa的情况下沉积的薄膜中的金属。

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  • 来源
    《Japanese journal of applied physics》 |2012年第8issue2期|p.08HF04.1-08HF04.4|共4页
  • 作者单位

    Research Institute of Electronics, Shizuoka University, Hamamatsu 432-8011, Japan;

    Research Institute of Electronics, Shizuoka University, Hamamatsu 432-8011, Japan;

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