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首页> 外文期刊>Japanese journal of applied physics >Low-Temperature Back-Surface-Field Structures Applied to Crystalline Silicon Solar Cells: Two-Step Growth with Hydrogen Plasma Treatment for Improving the Reproducibility
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Low-Temperature Back-Surface-Field Structures Applied to Crystalline Silicon Solar Cells: Two-Step Growth with Hydrogen Plasma Treatment for Improving the Reproducibility

机译:应用于晶体硅太阳能电池的低温后场结构:采用氢等离子体处理的两步生长法,以提高再现性

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摘要

We sometimes observe poor internal quantum efficiency (IQE) in the long-wavelength region of p-type single-crystalline silicon (c-Si) solar cells having back-surface-field (BSF) layers made of p-type hydrogenated amorphous silicon (a-Si:H). We found that this poor IQE is caused by the appearance of a polycrystalline phase (PP) in a-Si:H. We showed that two-step growth of BSF structures with hydrogen plasma treatment (HPT) is effective for achieving a high performance of BSF with improved reproducibility. First, a-Si:H layers were prepared on c-Si substrates at a high growth rate to suppress the appearance of PP, and consequently, the defects at the a-Si:H/c-Si interface induced by the higher growth rate were effectively passivated by HPT. Finally, a-Si:H was deposited as a capping layer on the first a-Si:H layer after HPT. We will discuss the passivation mechanism of interface defects with HPT using the data of the hydrogen profile in the a-Si:H layers treated by hydrogen plasma.
机译:我们有时会在具有由p型氢化非晶硅制成的背场(BSF)层的p型单晶硅(c-Si)太阳能电池的长波长区域中观察到较差的内部量子效率(IQE)( a-Si:H)。我们发现这种不良的IQE是由a-Si:H中多晶相(PP)的出现引起的。我们表明,采用氢等离子体处理(HPT)的BSF结构两步生长可有效提高BSF的性能,并提高重现性。首先,以高生长速率在c-Si基板上制备a-Si:H层以抑制PP的出现,因此,由较高生长速率引起的a-Si:H / c-Si界面缺陷被HPT有效钝化了。最后,在HPT之后的第一a-Si:H层上沉积a-Si:H作为覆盖层。我们将使用氢等离子体处理过的a-Si:H层中的氢剖面数据来讨论HPT界面缺陷的钝化机理。

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  • 来源
    《Japanese journal of applied physics》 |2012年第10issue2期|10NA13.1-10NA13.4|共4页
  • 作者单位

    Research Center for Photovoltaic Technologies, National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki 305-8568, Japan;

    Research Center for Photovoltaic Technologies, National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki 305-8568, Japan;

    Research Center for Photovoltaic Technologies, National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki 305-8568, Japan;

    Research Center for Photovoltaic Technologies, National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki 305-8568, Japan;

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