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GaN Nanowires Grown on a Graphite Substrate by Radio Frequency Molecular Beam Epitaxy

机译:射频分子束外延生长在石墨衬底上的GaN纳米线

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摘要

Self-assembled GaN and InGaN nanowires (NWs) were directly grown on a highly oriented pyrotytic graphite (HOPG) substrate by radio frequency molecular beam epitaxy (RF-MBE). The GaN NWs grown on HOPG had a shorter length and larger diameter than those grown conventionally on a Si(111) substrate based on the analysis of scanning electron microscopy (SEM) images. They were also found to have good crystalline qualities with few stacking faults, as determined by scanning transmission electron microscopy (STEM) analysis. Photoluminescence (PL) measurements at room temperature indicated that the luminescence intensity of the GaN NWs on HOPG is stronger than that of NWs grown on a Si(111) substrate; however, the InGaN NWs on both substrates showed similar tendencies with respect to the shift of the luminescence wavelength as a function of the growth temperature. While In incorporation decreased as the growth temperature increased, the uniformity of the InGaN NW arrays improved rapidly.
机译:自组装的GaN和InGaN纳米线(NW)通过射频分子束外延(RF-MBE)直接生长在高度取向的热解石墨(HOPG)衬底上。根据扫描电子显微镜(SEM)图像分析,在HOPG上生长的GaN NW比在Si(111)衬底上常规生长的GaN NW的长度短且直径大。通过扫描透射电子显微镜(STEM)分析确定,它们还具有良好的晶体质量,几乎没有堆垛层错。室温下的光致发光(PL)测量表明,HOPG上的GaN NW的发光强度强于在Si(111)衬底上生长的NW的发光强度;然而,两个衬底上的InGaN NW相对于发光波长随生长温度的变化表现出相似的趋势。尽管随着生长温度的升高,掺入量减少,但InGaN NW阵列的均匀性迅速提高。

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  • 来源
    《Japanese journal of applied physics》 |2013年第8issue2期|08JE07.1-08JE07.4|共4页
  • 作者单位

    Department of Electrical Engineering and Computer Science, Akasaki Research Center, Nagoya University, Nagoya 464-8603, Japan;

    Department of Electrical Engineering and Computer Science, Akasaki Research Center, Nagoya University, Nagoya 464-8603, Japan;

    Department of Electrical Engineering and Computer Science, Akasaki Research Center, Nagoya University, Nagoya 464-8603, Japan;

    Department of Electrical Engineering and Computer Science, Akasaki Research Center, Nagoya University, Nagoya 464-8603, Japan;

    Department of Electrical Engineering and Computer Science, Akasaki Research Center, Nagoya University, Nagoya 464-8603, Japan;

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