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首页> 外文期刊>Japanese journal of applied physics >Thin-film solar cells with InGaAs/GaAsP multiple quantum wells and a rear surface etched with light trapping micro-hole array
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Thin-film solar cells with InGaAs/GaAsP multiple quantum wells and a rear surface etched with light trapping micro-hole array

机译:具有InGaAs / GaAsP多量子阱和刻有光阱微孔阵列刻蚀后表面的薄膜太阳能电池

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摘要

A light trapping effect in GaAs p-i-n solar cells with InGaAs/GaAsP multiple quantum wells (MQWs) in the i-layer was demonstrated by applying a light scattering texture to the rear surface of the cell. A thin-film MQW solar cell was successfully fabricated by metal organic vapor phase epitaxy (MOVPE) to grow an inverted n-i-p photovoltaic (PV) structure; this structure was then transferred to a Si support substrate to prevent optical loss due to free carrier absorption. For the light scattering texture, the use of both the wet-etched micro-hole arrayed SiO2 dielectric layer on the rear surface of the cell and the secondarily etched micro hole array on the GaAs layer was attempted. On the SiO2 layer, the micro hole array pattern was obtained by the radio frequency sputtering of the layer followed by wet etching with photolithographic patterning. On the GaAs layer, the micro-hole array pattern was obtained by direct etching through a SiO2 template. Compared with the light scattering effects of the micro-hole-arrayed SiO2 layer, the secondarily etched GaAs rear contact layer showed a significant improvement in external quantum efficiency (EQE) in the wavelength range from 855 to 1000 nm that corresponds to the photon absorption wavelength in MQWs. (C) 2015 The Japan Society of Applied Physics
机译:通过在光电池的背面施加光散射纹理,证明了在i层中具有InGaAs / GaAsP多量子阱(MQW)的GaAs p-i-n太阳能电池中的光捕获效果。通过金属有机气相外延(MOVPE)成功地制造了薄膜MQW太阳能电池,以生长倒置的n-i-p光伏(PV)结构。然后将这种结构转移到Si支撑衬底上,以防止由于自由载流子吸收而造成的光学损失。对于光散射纹理,尝试使用在电池的后表面上的湿法蚀刻的微孔阵列的SiO 2介电层和在GaAs层上的二次蚀刻的微孔阵列。在SiO 2层上,通过对该层进行射频溅射,然后通过光刻构图进行湿法蚀刻,获得微孔阵列图案。在GaAs层上,通过直接蚀刻通过SiO 2模板获得微孔阵列图案。与微孔排列的SiO2层的光散射效应相比,二次蚀刻的GaAs后接触层在对应于光子吸收波长的855-1000 nm波长范围内显示出外部量子效率(EQE)的显着改善在MQW中。 (C)2015年日本应用物理学会

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  • 来源
    《Japanese journal of applied physics》 |2015年第8s1期|08KA13.1-08KA13.5|共5页
  • 作者单位

    Univ Tokyo, Res Ctr Adv Sci & Technol, Meguro Ku, Tokyo 1538904, Japan.;

    Univ Tokyo, Sch Engn, Dept Elect Engn & Informat Syst, Bunkyo Ku, Tokyo 1138656, Japan.;

    Univ Tokyo, Res Ctr Adv Sci & Technol, Meguro Ku, Tokyo 1538904, Japan.;

    Univ Tokyo, Sch Engn, Dept Elect Engn & Informat Syst, Bunkyo Ku, Tokyo 1138656, Japan.;

    Univ Tokyo, Sch Engn, Dept Elect Engn & Informat Syst, Bunkyo Ku, Tokyo 1138656, Japan.;

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