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Numerous flaked particles instantaneously generated by micro-arc discharge in mass-production plasma etching equipment

机译:大量生产的等离子刻蚀设备中微弧放电瞬间产生的大量片状颗粒

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摘要

The relationship between the instantaneous generation of flaked particles and micro-arc discharge is investigated in mass-production plasma etching equipment. To investigate the mechanism of such particle generation, we simultaneously detect particle generation from deposited films on a ground electrode and occurrence of micro-arc discharge under mass-production conditions. The results indicate that the deposited films are severely damaged and flake off as numerous particles when micro-arc discharge occurs. The rapid changes in floating potential on the films due to micro-arc discharge cause electric field stress, which works as an impulsive force. The particles are generated not from the melting of chamber parts by micro-arc discharge but from the flaking of deposited films by electric field stress acting as an impulsive force.
机译:在大量生产的等离子刻蚀设备中研究了片状颗粒的瞬时生成与微弧放电之间的关系。为了研究这种颗粒产生的机理,我们同时检测了在接地电极上沉积的薄膜中颗粒的产生以及在大规模生产条件下微弧放电的发生。结果表明,当微弧放电发生时,沉积的膜受到严重破坏并剥落成许多颗粒。由于微弧放电,膜上浮置电位的快速变化会引起电场应力,这是一种脉冲力。颗粒的产生不是通过微弧放电使腔室部件熔化,而是由于作为脉冲力的电场应力使沉积的薄膜剥落而产生的。

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  • 来源
    《Japanese journal of applied physics》 |2015年第1s期|01AE02.1-01AE02.6|共6页
  • 作者单位

    Measurement Solution Research Center, National Institute of Advanced Industrial Science and Technology (AIST), Tosu, Saga 841-0052, Japan;

    Measurement Solution Research Center, National Institute of Advanced Industrial Science and Technology (AIST), Tosu, Saga 841-0052, Japan;

    Measurement Solution Research Center, National Institute of Advanced Industrial Science and Technology (AIST), Tosu, Saga 841-0052, Japan;

    Measurement Solution Research Center, National Institute of Advanced Industrial Science and Technology (AIST), Tosu, Saga 841-0052, Japan;

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