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首页> 外文期刊>Japanese journal of applied physics >Impact of boron incorporation on properties of silicon solar cells employing p-type polycrystalline silicon grown by aluminum-induced crystallization
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Impact of boron incorporation on properties of silicon solar cells employing p-type polycrystalline silicon grown by aluminum-induced crystallization

机译:掺硼对采用铝诱导结晶生长的p型多晶硅的硅太阳能电池性能的影响

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摘要

We report on our attempt to increase the carrier density in the p-type polycrystalline silicon (poly-Si) layers grown by aluminum-induced crystallization (AIC) employing a B-doped Si target. Hall measurement revealed that we could obtain a lower-resistance and heavily doped p-type continuous poly-Si thin layer formed by AIC using B-doped a-Si. According to our evaluation of tunnel oxide passivated contact (TOPCon) solar cells with AIC-grown poly-Si, the AIC-TOPCon solar cells fabricated at 570 degrees C using B-doped a-Si showed higher conversion efficiency of 13.5% than that of 12.8% when using nondoped a-Si. It is considered that the cell characteristics, particularly FF and V-oc, were improved owing to the lower series resistance and higher carrier density since both Al and B were successfully incorporated into the AIC-grown poly-Si. (C) 2018 The Japan Society of Applied Physics
机译:我们报告了我们的尝试,以增加通过采用B掺杂Si靶的铝诱导结晶(AIC)所生长的p型多晶硅(poly-Si)层中的载流子密度。霍尔测量表明,通过使用B掺杂a-Si的AIC可以形成低电阻,重掺杂的p型连续多晶硅薄层。根据我们对带有AIC生长的多晶硅的隧道氧化物钝化接触(TOPCon)太阳能电池的评估,使用B掺杂的a-Si在570摄氏度下制造的AIC-TOPCon太阳能电池的转化效率比普通AIC-TOPCon太阳能电池高13.5%。使用非掺杂a-Si时为12.8%。人们认为,由于较低的串联电阻和较高的载流子密度,改善了电池特性,特别是FF和V-oc,这是因为Al和B都成功地掺入了AIC生长的多晶硅中。 (C)2018日本应用物理学会

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  • 来源
    《Japanese journal of applied physics》 |2018年第8s3期|08RB12.1-08RB12.4|共4页
  • 作者单位

    Nagoya Univ, Grad Sch Engn, Dept Mat Proc Engn, Nagoya, Aichi 4648603, Japan;

    Nagoya Univ, Grad Sch Engn, Dept Mat Proc Engn, Nagoya, Aichi 4648603, Japan;

    Nagoya Univ, Grad Sch Engn, Dept Mat Proc Engn, Nagoya, Aichi 4648603, Japan;

    Meiji Univ, Kawasaki, Kanagawa 2148571, Japan;

    Toyota Technol Inst, Nagoya, Aichi 4688511, Japan;

    Nagoya Univ, Grad Sch Engn, Dept Mat Proc Engn, Nagoya, Aichi 4648603, Japan;

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