Synthetic-Aperture Assessment of a Dispersive Surface

摘要

This article considers Synthetic Aperture Radar and other synthetic-aperture imaging systems in which a backscat-tered wave is measured from a variety of locations. We focus on the case in which the ground-reflectivity function depends on frequency as well as on position. We begin with a (linearized) mathematical model, based on a scalar approximation to Maxwell's equations, which includes the effects of the source waveform and the antenna beam pattern. The model can also accommodate other effects such as antenna steering and motion. For this mathematical model, we use the tools of microlocal analysis to develop and analyze a three-dimensional inversion algorithm that uses measurements made on a surface and determines the frequency-dependent ground reflectivity.