Mixed-signal on-chip timing measurements

摘要

On-chip test techniques to reduce the dependence on external testers and to improve high-frequency measurement accuracy have become a major focus in test research and development. This paper reviews the fundamental theory of timing measurements, a popular requirement for on-chip tests, and describes a wide range of circuit techniques to implement the theory. Results are presented to verify the circuit performance and limitations. A framework for timing measurement is proposed to benchmark further developments in this area.