Design of mixed-signal systems for testability

摘要

Significant differences in fault models and test methodologies used for analog and digital circuits make a common test for a mixed-signal device difficult. A divide and conquer strategy partitions the circuit into three types of blocks: analog, digital logic and memory. The test and design for testability methods for each type of block exist but assume a direct access to the block under test. Thus, an additional design for testability structure using boundary scan and mixed-signal test bus is incorporated for effective test application. With this design, separate specialized tests are applied to analog and digital parts, as well as to interconnects.