On-line testing for VLSI: state of the art and trends

摘要

This paper discusses the state of the art and future trends of on-line testing techniques for VLSI. It cautions that emerging technological constraints and application requirements will expend dramatically the use of these techniques. In particularly, various industrial (e.g. railway control, satellites, avionics, telecommunications, control of critical automo- tive functions, medical electronics, industrial control, etc.), have increasing needs of various on-line testing features. Some of these applications concern mass production and should support the standardization of such techniques and the development of commercial CAD tools supporting them.