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I_DDQ testing: state of the art and future trends

机译:I_DDQ测试:最新技术和未来趋势

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摘要

Quality assurance in electronic components and systems requires effective test strategies to be applied to ICs of increasing complexity and size. The traditional voltage techniques based on logic observation of the outputs have been found insufficient to guaranty the low defect escape requirements of growing sectors of IC users. This fact has motivated the search for complementary testing techniques which try to detect defects escaping logic testing. This paper attempts to explore the state of the art and the perspective of the test based on the observation of the quiescent current consumption of the IC, generally known as I_DDQ testing.
机译:电子元件和系统的质量保证要求将有效的测试策略应用于日益复杂和规模越来越大的IC。已经发现基于输出逻辑观察的传统电压技术不足以保证增长的IC用户的低缺陷逃逸要求。这一事实促使人们寻求互补的测试技术,这些技术试图检测逃避逻辑测试的缺陷。本文试图通过观察IC的静态电流消耗来探索测试的技术水平和测试的前景,通常称为I_DDQ测试。

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