Testing with decision diagrams

摘要

Decision diagrams (DDs) are the state-of-the-art data structure in VLSI CAD. They are widely used and in the mean time have also been integrated in commercial tools. In the following special interest is devoted to the use of DDs in the area of testing. We give a brief review of test algorithms successfully using the capabilities of DDs as a data structure for tasks like fault detection, synchronization and built-in-self-test. In the main part of the paper we concentrate on synthesis br testability approaches where circuits are derived from DD representations. Depending on the type of the DD and its structural properties differing classes of DD-circuits result.