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A SPAD-based random number generator pixel based on the arrival time of photons

机译:基于光子到达时间的基于SPAD的随机数生成器像素

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摘要

A quantum random generator based on photon detection is here presented. The system consists of a photon source, typically a commercial LED, coupled with a detector with single photon detection capability. The detector is composed of a Single-Photon Avalanche Diode (SPAD) and a time stamp circuit, which samples the arrival time of impinging photons within a predefined temporal window. The proposed implementation optimizes the area, allowing embedding all circuitry into a single pixel, and increases the efficiency of random bit extraction. Moreover, the adopted fast pre-charge mode of the SPAD quenching circuit reduces the afterpulsing probability, and hence possible undesirable correlation in the resulting random bit sequence. Thanks to the implemented random bit extraction, experimental results show that the pixel has a flat behavior for a significant range of light intensity, which makes the pixel robust against variations of external PVT parameters. The maximum achievable bit rate has been measured equal to 1 Mbps, while random sequences are shown to pass NIST tests without any post-processing.
机译:这里介绍了一种基于光子检测的量子随机发生器。该系统由一个光子源(通常是商用LED)和一个具有单光子检测功能的检测器组成。该探测器由单光子雪崩二极管(SPAD)和时间戳电路组成,该时间戳电路在预定的时间窗口内采样撞击光子的到达时间。所提出的实现方式优化了面积,允许将所有电路嵌入单个像素中,并提高了随机位提取的效率。而且,SPAD猝灭电路所采用的快速预充电模式降低了后脉冲概率,并因此降低了所得随机比特序列中可能的不希望的相关性。由于实施了随机位提取,实验结果表明,该像素在较大的光强度范围内具有平坦的行为,这使该像素能够抵抗外部PVT参数的变化。经测量,最大可达到的比特率等于1 Mbps,而随机序列显示可通过NIST测试,而无需任何后处理。

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