A Comparison of Uncertainty Evaluation Methods for On-Wafer $S$-Parameter Measurements

摘要

An experimental analysis of on-wafer $S$-parameter uncertainties is presented. Recently, two different approaches, based either on differential numerical programming or on a fully analytical solution, have been introduced. In order to establish their suitability, a careful comparison is given for on-wafer measurements. Through this comparison, possible limitations and causes of errors are also highlighted. Finally, the uncertainty evaluation of the 16-term error model is presented for the first time.