Short-Range Image-Based Method for the Inspection of Strong Scatterers Using Microwaves

摘要

In this paper, a new inverse-scattering-based reconstruction method is presented. The aim of the approach is to “invert” wavefield samples, which are collected by experimental tomographic systems working at radio frequencies and microwaves. Imaging systems operating in this band require the solution of a nonlinear and highly ill-posed inverse problem. The need to regularize the inverse problem is addressed here by considering an efficient Inexact Newton method that is able to inspect strong scatterers. In this paper, the mathematical formulation of the approach is detailed and discussed. Moreover, the results of several numerical simulations concerning the reconstructions of dielectric structures in noisy environments and in several applicative scenarios are reported.