A statistical technique for the error correction of scan conversion-based transient digitizers is presented. The technique is based on the identification of the error model and on the assessment of the related correction feasibility. The identification of the error model is carried out for the charge distribution on each column of the target diode matrix of the scan digitizer through a suitable experimental procedure. The feasibility of the error correction is assessed on the basis of the statistical significance of the model identification by means of a decision-making procedure. A suitable index is utilized to verify the likelihood of carrying out a significant correction. Furthermore, for scan digitizers having a reference offset generator, a self-calibrating function based on the proposed technique is suggested. Finally, experimental results of the technique application to an actual scan conversion-based transient digitizer showing a significant error reduction are discussed.
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