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A Measurement Technique for Verifying the Match Condition of Assembled RFID Tags

机译:一种验证装配好的RFID标签匹配条件的测量技术

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摘要

In radio frequency identification (RFID) tag design, many measurement methods are available for individually characterizing either the RFID chip or the antenna; however, to the best of the knowledge of the authors, no direct method has been developed for the assembled RFID tag. In this paper, a measurement method for verifying the match condition of the assembled RFID tag is proposed. The proposed method can not only verify the final impedance match condition of the assembled RFID tags but also be used to identify the resistance and reactance mismatch condition between the RFID chip and the antenna. Furthermore, the measurement data obtained from the verification method can be used to estimate the assembly error introduced by different mounting methods. The use of the corrected circuit model of the RFID chip impedance, which includes the assembly error, helps improve the accuracy of the RFID tag design. Five RFID tag antennas, each with a different complex impedance, are used to verify the proposed method. This paper compares the simulated and measured results to illustrate the application of the proposed verification method to the aforementioned RFID tag antennas. It is shown that the experimental tests for the maximum read range agree well with the measured data generated by using the proposed verification method.
机译:在射频识别(RFID)标签设计中,有许多测量方法可用于分别表征RFID芯片或天线。但是,据作者所知,尚未开发出用于组装RFID标签的直接方法。本文提出了一种用于检验组装好的RFID标签匹配条件的测量方法。所提出的方法不仅可以验证组装好的RFID标签的最终阻抗匹配条件,而且可以用于识别RFID芯片和天线之间的电阻和电抗失配条件。此外,从验证方法获得的测量数据可用于估计由不同安装方法引入的组装误差。 RFID芯片阻抗的校正电路模型的使用(其中包括装配误差)有助于提高RFID标签设计的准确性。使用五个RFID标签天线(每个天线具有不同的复阻抗)来验证所提出的方法。本文比较了仿真结果和测量结果,以说明所提出的验证方法在上述RFID标签天线中的应用。结果表明,最大读取范围的实验测试与使用所提出的验证方法生成的测量数据非常吻合。

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