The SICK 0L1 delivers precision detection in the micrometer range

摘要

The SICK OL1 Optical Micrometer is a highly-accurate, miniature and rugged addition to SICK's portfolio of displacement technologies for thread, material thickness and edge measurements in continuous, sheet feeding and winding machines. The SICK OL1 Optical Micrometer is a rugged instrument for integration into small spaces. With a miniature sender and receiver placed up to 300mm apart, it uses light curtain measurement technology, based on a multipixel, linear CMOS sensor, for high-precision, high-repeatability measurement and process control in the micrometer range. The OL1 is teamed with the SICK AOD1 Mini displacement evaluation unit for improved stability and consistency of output. With a 10mm light band and detection resolution down to 0.2mm, the OL1 Optical Micrometer is a versatile and stable performer at short ranges, small tolerances and for handling thin materials, so it can support precision applications in paper, printing and packaging machines. "SICK was able to apply its worldleading expertise in light curtain technology to develop a technology with micrometer accuracy that delivers high accuracy and efficiency in 1D and 2D profiling and displacement measurement within very limited space," says Neil Sandhu, SICK's UK Product Manager for Imaging, Measurement and Ranging.