Spectrum-based fault localization in software product lines

摘要

Context Software Product Line (SPL) testing is challenging mainly due to the potentially huge number of products under test. Most of the research on this field focuses on making testing affordable by selecting a representative subset of products to be tested. However, once the tests are executed and some failures revealed, debugging is a cumbersome and time consuming task due to difficulty to localize and isolate the faulty features in the SPL.