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Functional and Consumption Analysis of Integrated Circuits Supplied by Inductive Power Transfer by Powering Modulation and Lock-In Infrared Imaging

机译:调制调制和锁定红外成像为感应功率传输提供集成电路的功能和功耗分析

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摘要

The functionality and consumption of a Radio Frequency IDentification Integrated Circuit (RFID IC) supplied by inductive power transfer has been noninvasively analyzed. This has been done by means of an InfraRed Lock-In Thermography (IR-LIT) system and frequency modulating the RFID IC powering scheme by biasing the external powering coil considering several amplitude modulation waveforms. This generates thermal harmonics at the beating frequency in all IC blocks, enabling their detection as heat sources by IR-LIT. The main aspects addressed in this investigation have been the following: the suitability study of the proposed modulation strategies, the characterization of the coupling between coils and its effects on the RFID blocks, the RFID IC functional analysis, and the dependence of the local energy consumption on the total power delivered to the die. In addition, it has been determined that the RFID IC presents a dysfunction due to the deactivation of some blocks during operation. Results suggest that this unexpected behavior is due to a desynchronization between some of the RFID blocks. Consequently, this stops the internal control signal, deactivates some specific RFID blocks, and ceases the back-telemetry block operation.
机译:已经无创地分析了感应功率传输提供的射频识别集成电路(RFID IC)的功能和功耗。这是通过红外锁定热成像(IR-LIT)系统并通过考虑几个幅度调制波形对外部供电线圈施加偏压来对RFID IC供电方案进行频率调制来完成的。这会在所有IC模块中以跳动频率产生热谐波,从而使它们能够被IR-LIT检测为热源。该调查研究的主要方面如下:提出的调制策略的适用性研究,线圈之间的耦合特性及其对RFID模块的影响,RFID IC功能分析以及局部能耗的依赖性传递给模具的总功率。另外,已经确定由于操作期间某些模块的去激活而导致RFID IC出现功能障碍。结果表明,这种意外行为是由于某些RFID模块之间的不同步所致。因此,这将停止内部控制信号,停用某些特定的RFID块,并停止后向遥测块操作。

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