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Balancing of Peak Currents Between Paralleled SiC MOSFETs by Drive-Source Resistors and Coupled Power-Source Inductors

机译:驱动源电阻和耦合电源电感在并联SiC MOSFET之间的峰值电流平衡

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摘要

The peak currents between two paralleled SiC MOSFETs could differ significantly due to the mismatch in threshold voltages . The method described herein employs passive compensation (drive-source resistors and coupled power-source inductors) to balance the peak currents using one gate driver, no sensors, and no feedback—without increasing total switching loss when equivalent gate-drive resistance is kept constant. This solution works for both polarities of mismatch and forces balancing from the first current peak. The extra voltage stress from this solution is mitigated by negative coupling. The passive components (resistance, self-inductance, and mutual inductance) are determined by an equation involving the magnitude of mismatch, current rise time, and unbalance percentage. The influence of other parasitic inductances on current sharing is analyzed. The robustness of this passive balancing method is experimentally verified by a prototype with a significant amount of parasitic inductances. Test results show that the difference of peak currents can be reduced from 15% to 3% without changing the switching loss and voltage stress.
机译:由于阈值电压的不匹配,两个并联的SiC MOSFET之间的峰值电流可能会显着不同。本文所述的方法采用无源补偿(驱动源电阻器和耦合的电源电感器),以使用一个栅极驱动器,无传感器和无反馈来平衡峰值电流,而当等效栅极驱动器电阻保持恒定时不会增加总开关损耗。该解决方案适用于不匹配的极性,并可以从第一个电流峰值开始进行平衡。该解决方案带来的额外电压应力可通过负耦合得到缓解。无源元件(电阻,自感和互感)由方程式确定,该方程式涉及失配的大小,电流上升时间和不平衡百分比。分析了其他寄生电感对均流的影响。这种无源平衡方法的鲁棒性已通过具有大量寄生电感的原型进行了实验验证。测试结果表明,在不改变开关损耗和电压应力的情况下,峰值电流差异可以从15%减小至3%。

著录项

  • 来源
    《IEEE Transactions on Industrial Electronics》 |2017年第10期|8334-8343|共10页
  • 作者单位

    Center for Power Electronics Systems, The Bradley Department of Electrical and Computer Engineering, Virginia Tech, Blacksburg, VA, USA;

    Center for Power Electronics Systems, The Bradley Department of Electrical and Computer Engineering, Virginia Tech, Blacksburg, VA, USA;

    Toyota Motor Engineering & Manufacturing North America, Ann Arbor, MI, USA;

    Center for Power Electronics Systems, The Bradley Department of Electrical and Computer Engineering, Virginia Tech, Blacksburg, VA, USA;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Inductance; MOSFET; Logic gates; Stress; Inductors; Switching loss; Transient analysis;

    机译:电感;MOSFET;逻辑门;应力;电感;开关损耗;瞬态分析;
  • 入库时间 2022-08-17 13:03:14

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