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An adaptive level-selecting wavelet transform for texture defect detection

机译:自适应水平选择小波变换在纹理缺陷检测中的应用

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摘要

We present an effective approach based on wavelet transform (WT) to detect defects on images with high frequency texture background. The original image is decomposed at various levels by WT. Then, by selecting an appropriate level at which the approximation sub-image is reconstructed, textures on the background are effectively removed. Thus, the difficult texture defect detection problem can be settled by non-texture techniques. An adaptive level-selecting scheme is presented by analyzing the co-occurrence matrices (COM) of the approximation sub-images. Experiments are done to detect the stains and broken points on texture surfaces. Comparisons with frequency domain low and high pass filters show that our method is much more effective.
机译:我们提出了一种基于小波变换(WT)的有效方法来检测具有高频纹理背景的图像上的缺陷。 WT对原始图像进行了各种分解。然后,通过选择适当的级别来重构近似子图像,可以有效去除背景上的纹理。因此,可以通过非纹理技术解决困难的纹理缺陷检测问题。通过分析近似子图像的共现矩阵(COM),提出了一种自适应的电平选择方案。进行实验以检测纹理表面上的污点和折点。与频域低通和高通滤波器的比较表明,我们的方法更为有效。

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