On Testing of Josephson Logic Circuits Composed of the 4JL Gates

摘要

We have specified typical fabrication defects of the current injection logic gates with four Josephson junctions (4JL gates), and then investigated the voltage an current behavior of defective gates by SPICE simulation to evaluate the defect coverage achieved by logic testing and current testing. The simulation results show that current testing may possibly achieve a high defect coverage while logic testing cannot detect almost half defects.