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Low-Leakage and Low-Power Implementation of High-Speed Logic Gates

机译:高速逻辑门的低泄漏和低功耗实现

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In this paper, we propose novel transmission-gate-based (TG-based) AND gates, TG-based OR gates, and pass-transistor logic gates that have new structures and have lower transistor counts than those proposed by other authors. AH our proposed gates operate in full swing and have less leakage currents and shorter delays than conventional CMOS gates. Compared with the conventional 65 nm CMOS gates, our proposed 65 nm gates in this paper can improve leakage currents, dynamic power consumption, and propagation delays by averages of 42.4%, 8.1%, and 13.5%, respectively. Logic synthesizers can use them to facilitate power reduction. The experimental results show that a commercial power optimization tool can further reduce the leakage current and dynamic power up to 39.85% and 18.69%, respectively, when the standard cell library used by the tool contains our proposed gates.
机译:在本文中,我们提出了新颖的基于传输门(基于TG)的AND门,基于TG的OR门和传输晶体管逻辑门,它们具有新的结构并且比其他作者提出的晶体管数量更少。与传统的CMOS栅极相比,我们建议的栅极可全速运行,泄漏电流较小,延迟较短。与传统的65 nm CMOS栅极相比,我们在本文中提出的65 nm栅极可以分别平均改善泄漏电流,动态功耗和传播延迟,分别为42.4%,8.1%和13.5%。逻辑合成器可以使用它们来降低功耗。实验结果表明,当该工具使用的标准单元库包含我们提出的门时,商用功率优化工具可以进一步将泄漏电流和动态功率分别降低至39.85%和18.69%。

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