首页> 外文期刊>IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control >Structure and properties of Bi(Zn0.5Ti0.5)O3??? Pb(Zr1???ξTiξ)O3 ferroelectric single crystals grown by a top-seeded solution growth technique
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Structure and properties of Bi(Zn0.5Ti0.5)O3??? Pb(Zr1???ξTiξ)O3 ferroelectric single crystals grown by a top-seeded solution growth technique

机译:Bi(Zn 0.5 Ti 0.5 )O 3 ??? Pb(Zr 1 ???ξ Ti ξ)O 3 铁电单晶

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摘要

Bi(ZnTi)O (BZT)-modified Pb(ZrTi)O (PZT) single crystals have been grown using a top-seeded solution growth technique and characterized by various methods. The crystal structure is found to be rhombohedral by means of X-ray powder diffraction. The composition and homogeneity of the as-grown single crystals are studied by laser ablation inductively coupled plasma mass spectrometry and X-ray photoelectron spectroscopy. The domain structure of a (001) platelet is investigated by polarized light microscopy (PLM), which confirms the rhombohedral symmetry. The paraelectric-to-ferroelectric phase transition temperature T is found to be 313°C with the absence of rhombohedral???tetragonal phase transition. The ferroelectric properties of the ternary crystals are enhanced by the BZT substitution with a remanent polarization of 28 μC/cm and a coercive field E of 22.1 kV/cm.
机译:Bi(ZnTi)O(BZT)改性的Pb(ZrTi)O(PZT)单晶已使用顶部播种溶液生长技术生长,并通过各种方法进行了表征。通过X射线粉末衍射发现晶体结构为菱面体。通过激光烧蚀电感耦合等离子体质谱和X射线光电子能谱研究了生长态单晶的组成和均匀性。 (001)血小板的域结构通过偏振光显微镜(PLM)进行了研究,这证实了菱面体的对称性。发现顺电至铁电的相变温度T为313℃,而没有菱面体的四方相变。通过BZT取代增强了三元晶体的铁电性能,剩余极化强度为28μC/ cm,矫顽场E为22.1 kV / cm。

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