Fault diagnosis of electronic systems using intelligent techniques:a review

摘要

In an increasingly competitive marketplace system complexityncontinues to grow, but time-to-market and lifecycle are reducing. Thenpurpose of fault diagnosis is the isolation of faults on defectivensystems, a task requiring a high skill set. This has driven the need fornautomated diagnostic tools. Over the last two decades, automatedndiagnosis has been an active research area, but the industrialnacceptance of these techniques, particularly in cost-sensitive areas,nhas not been high. This paper reviews this research, primarily coveringnrule-based, model-based, and case-based approaches and applications.nFuture research directions are finally examined, with a concentration onnissues, which may lead to a greater acceptance of automated diagnosis