Estimation of proton upset rates from heavy ion test data (ICs)

摘要

A simple method of calculating the proton upset rates from heavy ion test data is presented. Given the approximations made, particularly in fitting a curve to the experimental data, the error made in determining the upset rate can be as large as four or six. It is clear from this model that ICs with heavy ion thresholds <10 MeV/(mg/cm/sup 2/) will probably not upset with protons. In critical applications ICs with LET thresholds less than 10 MeV/(mg/cm/sup 2/) should be tested with protons, or at the minimum careful heavy ion test data should be taken in the low LET regions (for heavy ion upset considerations as well as proton upset).