Low-frequency noise characterization of very large value resistors

摘要

A simple circuit configuration is described that allows one to characterize the noise of very large value resistors. With this measurement setup, we investigated, at different bias voltages, the low-frequency noise of large value resistors, tens of G/spl Omega/ range, realized with different technologies. A technique is suggested that allows reducing the low-frequency noise contribution by optimizing the connecting arrangement. A short review of the resistor noise theory is given.