首页> 外文期刊>IEEE Transactions on Medical Imaging >Estimation of Basis Line-Integrals in a Spectral Distortion-Modeled Photon Counting Detector Using Low-Order Polynomial Approximation of X-ray Transmittance
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Estimation of Basis Line-Integrals in a Spectral Distortion-Modeled Photon Counting Detector Using Low-Order Polynomial Approximation of X-ray Transmittance

机译:使用X射线透射率的低阶多项式近似估计光谱畸变模型光子计数检测器中的基线积分。

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Photon counting detector (PCD)-based computed tomography exploits spectral information from a transmitted x-ray spectrum to estimate basis line-integrals. The recorded spectrum, however, is distorted and deviates from the transmitted spectrum due to spectral response effect (SRE). Therefore, the SRE needs to be compensated for when estimating basis line-integrals. One approach is to incorporate the SRE model with an incident spectrum into the PCD measurement model and the other approach is to perform a calibration process that inherently includes both the SRE and the incident spectrum. A maximum likelihood estimator can be used to the former approach, which guarantees asymptotic optimality; however, a heavy computational burden is a concern. Calibration-based estimators are a form of the latter approach. They can be very efficient; however, a heuristic calibration process needs to be addressed. In this paper, we propose a computationally efficient three-step estimator for the former approach using a low-order polynomial approximation of x-ray transmittance. The low-order polynomial approximation can change the original non-linear estimation method to a two-step linearized approach followed by an iterative bias correction step. We show that the calibration process is required only for the bias correction step and prove that it converges to the unbiased solution under practical assumptions. Extensive simulation studies validate the proposed method and show that the estimation results are comparable to those of the ML estimator while the computational time is reduced substantially.
机译:基于光子计数检测器(PCD)的计算机断层扫描利用来自透射X射线光谱的光谱信息来估计基本线积分。但是,由于光谱响应效应(SRE),记录的光谱会失真并偏离透射光谱。因此,在估计基准线积分时,需要对SRE进行补偿。一种方法是将具有入射光谱的SRE模型合并到PCD测量模型中,另一种方法是执行固有地包括SRE和入射光谱的校准过程。可以将最大似然估计器用于前一种方法,从而保证了渐近最优性。但是,很重的计算负担是一个问题。基于校准的估计器是后一种方法的一种形式。它们可能非常有效;但是,启发式校准过程需要解决。在本文中,我们为X射线透射率的低阶多项式近似,为前一种方法提出了一种计算有效的三步估计器。低阶多项式逼近可以将原始的非线性估计方法更改为两步线性化方法,然后进行迭代偏差校正步骤。我们证明了校准过程仅是偏差校正步骤所必需的,并证明它在实际假设下收敛于无偏解。大量的仿真研究验证了该方法的有效性,并表明该方法的估计结果与ML估计器的结果相当,而计算时间却大大减少了。

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