首页> 外文期刊>IEEE Transactions on Magnetics >Intrinsic Threshold Current Density of Domain Wall Motion in Nanostrips With Perpendicular Magnetic Anisotropy for Use in Low-Write-Current MRAMs
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Intrinsic Threshold Current Density of Domain Wall Motion in Nanostrips With Perpendicular Magnetic Anisotropy for Use in Low-Write-Current MRAMs

机译:用于低写入电流MRAM的具有垂直磁各向异性的纳米带中畴壁运动的固有阈值电流密度

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摘要

In this paper, we have calculated the intrinsic threshold current density of domain wall (DW) motion in nanostrips with perpendicular magnetic anisotropy (PMA) and have estimated writing properties of magnetic random access memories (MRAMs) with DW motion. Carrying out a micromagnetic simulation, we revealed that the intrinsic threshold current density decreases with decreases in the strip thickness, width, and magnetization, whereas it did not depend significantly on magnetocrystalline anisotropy and exchange stiffness. These results showed good agreement with one-dimensional (1-D) analysis. We also found that current-induced DW motion in PMA strips may have potential for use in low-write-current MRAMs. For a width of less than roughly 100 nm, comparable properties to those of existing memories can be obtained.
机译:在本文中,我们已经计算了具有垂直磁各向异性(PMA)的纳米带中畴壁(DW)运动的固有阈值电流密度,并估计了具有DW运动的磁随机存取存储器(MRAM)的写入性能。通过进行微磁模拟,我们发现固有的阈值电流密度随带钢厚度,宽度和磁化强度的降低而降低,而与磁晶各向异性和交换刚度无关。这些结果与一维(1-D)分析显示出良好的一致性。我们还发现,电流引起的PMA条带中的DW运动可能具有用于低写入电流MRAM的潜力。对于小于大约100nm的宽度,可以获得与现有存储器相当的性能。

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