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Well and Polarization Effects on Carrier Distribution and Interband Transitions in NUV Light-Emitting Diodes

机译:阱和极化对NUV发光二极管中载流子分布和带间跃迁的影响

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The illumination efficiency and the relevant physical mechanism of near-ultraviolet (NUV) AlGaN-based light-emitting diodes (LEDs) are investigated numerically. In particular, the interrelationship of quantum well (QW) thickness and degree of polarization, and the relevant influence on the light output power of NUV LEDs are systematically studied. Simulation results indicate that the use of wider QWs with less polarization field is beneficial in suppressing the Auger recombination by reducing the carrier density. However, the structure with wider QWs suffers from severer spatial separation of electron and hole wave functions within the QW, which is more sensitive to the degree of polarization in its optical performance. To resolve this problem, the quaternary AlInGaN is proposed as the material of quantum barriers in wide QWs, in which the polarization mismatch between the QW and the barrier is reduced and the relevant quantum-confined Stark effect is relieved consequently.
机译:数值研究了近紫外线(NUV)AlGaN基发光二极管(LED)的照明效率和相关的物理机理。特别是,系统地研究了量子阱(QW)厚度和偏振度之间的相互关系,以及对NUV LED的光输出功率的相关影响。仿真结果表明,使用极化场较小的宽量子阱有利于通过降低载流子密度来抑制俄歇复合。然而,具有较宽QW的结构在QW内遭受电子和空穴波功能的更严格的空间分离,这对其光学性能中的偏振度更加敏感。为了解决这个问题,提出了一种四元AlInGaN作为宽量子阱中的量子势垒材料,这种量子阱可以减小量子阱和势垒之间的极化失配,从而减轻相关的量子限制斯塔克效应。

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