首页> 外文期刊>Fusion Engineering and Design >Analysis of thermal and structural responses of a new diagnostic probe to repeated exposure in ASDEX upgrade tokamak
【24h】

Analysis of thermal and structural responses of a new diagnostic probe to repeated exposure in ASDEX upgrade tokamak

机译:Asdex升级Tokamak中新诊断探针的热和结构应答分析

获取原文
获取原文并翻译 | 示例
       

摘要

Thermal and structural responses of a new diagnostic probe inside the AUG (ASDEX Upgrade) tokamak has been analysed numerically. This new reciprocating probe has been developed as a multi-diagnostic device for measuring several plasma parameters simultaneously. It is constructed as a universal probe that can be used in different tokamaks by applying corresponding adapters. The probe head design has to go through a number of tests (numerical and experimental) before it can be used in the actual tokamak environment, where it has to withstand repeated exposure to energetic particle fluxes in the scrape-off layer plasma. In this respect, the probe resilience to the heat loads in AUG has been investigated numerically. The performed transient analyses correspond to a typical triple insertion of the probe head into the plasma during a plasma discharge experiment in AUG. Thermal and mechanical responses of the most critical parts of the probe have been analysed. To avoid the potential pollution of the vacuum vessel, thermal resistance and structural integrity of the probe`s protective shroud have been studied in particular. The protective shroud has been constructed specifically for AUG. The simulations have shown that the shroud is able to withstand the expected plasma exposure and provides sufficient protection for the probe diagnostic and structural parts.
机译:在数值上分析了AUG(ASDEX升级)托卡卡克内部新诊断探针的热和结构响应。该新的往复探测器已经开发为用于同时测量多个等离子体参数的多诊断装置。它构造为通过施加相应的适配器来构造成可用于不同的TOKAMAK。探头设计必须经过许多测试(数值和实验),然后可以在实际的Tokamak环境中使用,在那里它必须承受刮擦层等离子体中的重复暴露于能量粒子通量的重复暴露。在这方面,在数值上研究了AUG中的热负荷的探针弹性。所执行的瞬态分析对应于8月的等离子体放电实验期间探头进入等离子体的典型三倍插入等离子体。分析了探头最关键部位的热量和机械响应。为了避免真空容器的潜在污染,特别是探针探针的热阻和结构完整性。保护罩已经专门为8月设计。仿真表明,护罩能够承受预期的等离子体暴露,并为探针诊断和结构部件提供足够的保护。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号