Boundary Scan for Mixed-Signal Controller Cards

摘要

Several conclusions can be made about our experience with boundary scan for testing both analog and digital circuitry. 1. Design aggressively with boundary scan. Even if it means adding hardware to support boundary scan testability, the justification often is warranted. In our case, it not only allowed for testability, it also reduced the actual development time. 2. Analog circuitry can be tested by a boundary scan-driven reference circuit and comparator approach using an active test fixture. 3. A boundary scan-based analog/digital test system offers high test coverage and is very cost-effective. 4. The time and effort saved by this approach allowed us to get complex products out of the lab and into production months quicker than with previous approaches.