Overcoming Overdrive Recovery

摘要

When making critical signal integrity measurements with a high-speed digital storage oscilloscope (DSO), it often is desirable to measure small aberrations on the top and bottom of high-speed digital signals. Examples include measuring overshoot, undershoot, and overall ripple. A common technique to increase the effective resolution and accuracy of these types of measurements is to offset the signal under test and then increase the vertical sensitivity around the portion of the waveform of interest. This spreads out the small aberrations of the signal over a larger range of the scope's analog-to-digital converter (ADC).