Reducing EVM Test Time And Identifying Failure Mechanisms

摘要

EVM production test is becoming a requirement for leading-edge MIMO/ OFDM devices because of its capability to test the system-level performance. Some device manufacturers have attempted to postpone the implementation of EVM testing because it will slow production test time and make it more difficult to identify the specific failure mechanism. By developing test algorithms that take advantage of the specific characteristics of EVM and the nature of production test, these concerns disappear. Table 1 demonstrates that not only can EVM testing be performed in substantially less time than traditional parametric testing, but it also can be accomplished even while identifying the failure mechanism for chips that fail EVM testing.