Fine-Pitch Test Probes

摘要

The μHEUX~® line of durable, fine-pitch probes is designed to test electrical targets with ±15-micron pointing accuracy on 10-mil center-to-center placement. Probe diameter sizes are 20, 16, 12, and 8 mils. The spring-loaded test probes can meet the mechanical challenges of testing miniaturerncircuits such as hybrids, RFID a ntennas, flex-circuits, flat panels, and photonic devices,rnand many package types such as StripLine, BGA, CSP, SOC, SIP, MEMS, and mem.