Design and Development Testing Part 2

摘要

This article briefly covers testing for design, development, and troubleshooting of CE, CS, RE, and RS EMC problems. For more information, some excellent books can help fill in the blanks:rn1. EMI Troubleshooting Techniques, Michel Mardiguian, McGraw Hill, 1999.rn2. The Technician EMI Handbook: Clues and Solutions, Joseph Carr, Newnes, 2000.rn3. High-Frequency Measurements and Noise in Electronic Systems, Doug Smith, John Wiley, 1992.