PXI system addresses digital and mixed-signal testing

摘要

The TS-900 PXI Semiconductor Test System for component, SOC, and SiP test applications offers up to 512 100-MHz channels with per-pin PMUs and an integrated receiver interface for digital and mixed-signal test applications. The 20-slot 3U chassis, available in a benchtop or cart configuration, supports a range of analog, power supply, and RF resources.