System supports I~2C and SPI testing capabilities

摘要

The IC100-S Mixed-Signal Tester incorporates an PC serial interface to 3.4 MHz and a SPI serial interface to 20 MHz and performs wafer probe and final test, incoming inspection, device characterization, failure analysis, reliability testing, and general-purpose lab work. It features up to 16 SMUs, 16 digital drivers with programmable VIH, 16 digital receivers with programmable Vt, 24-bit ADC, 32 independent loadboard relays, and five user-defined 16-bit DACs with ±10-V outputs.