Addressing New Requirements for Legacy Test Stations

摘要

Large-scale ATE like that used for maintaining defense and aerospace electronics has a typical lifetime of 20 years or more and can support mul tiple and equally large-scale platforms that may have an even longer lifespan. It is customary to upgrade the platform electronics periodically to improve func tionality and reliability, which may create requirements that exceed the capabilities of the ATE. An example is testing high speed digital buses that use technology developed over the past decade.