The S530 Parametric Test Systems now offer enhanced capabilities. Supported by the latest version of Keithley Test Environment software (KTE V5.4), the S530 can now be configured for 48-pin full Kelvin switching and with new integrated options for pulse generation, frequency measurements, and low-voltage measurements. A new high-speed, high-resolution oscilloscope option supports ring-oscillator testing over a broad frequency-measurement range. Options include a pulse generation capability and a 71/2-digit, low-noise digital multimeter optimized for low-voltage measurements.
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